原子力显微镜-显微系统-仪器设备-生物在线
原子力显微镜

原子力显微镜

商家询价

产品名称: 原子力显微镜

英文名称: AFM

产品编号: DP-AFM

产品价格: 0

产品产地: 德国

品牌商标: 德国

更新时间: null

使用范围: null

双极科技(香港)公司
  • 联系人 :
  • 地址 : 北京海淀区东北旺南路29号3-3
  • 邮编 :
  • 所在区域 : 北京
  • 电话 : 137****5113
  • 传真 :
  • 邮箱 : DUALPOLAR@163.COM

 

Our Level AFM offers a wide Spectrum of Measurement Methods:

  • High Resolution Dynamic & Contact Mode
     
  • Current-AFM Mode
     
  • Lateral Force Mode
  • Force Spectroscopy
     
  • Kelvin Probe Force Microscopy
     
  • Magnetic Force Microscopy
     
  • Electrical Force Microscopy
     
  • Nano-Lithography with script-language
     
  • Elastic Force Microscopy (Force Modulation Mode)
    SYSTEM PARAMETERS:
    lateral resolution: < 1 nm (practical resolution)
    technical resolution: 0.19 nm (18 bit achieved technical resolution)
    mathematical resolution: 32 Bit (< 0.1 pm)
    height resolution: < 150 pm noise floor in DNC (atomic steps and layers)
    technical resolution: 0.026 nm (18 bit achieved technical resolution)
    maximum scan range: 50 mm (standard, others possible on request), z-range: 6 μm
    maximum sample size: 4 cm x 6 cm
    manual positioning range: 5 mm x 5 mm
    accessories: 15 cantilevers; 1 calibration grating UMG01
    20 sample holders; 2 sample boxes, tweezers

OPTIONAL FEATURES (NOT NECESSARY FOR STANDARD APPLICATIONS):
1.Vibration isolation table under the microscope
2.Hardware scanner linearisation
3.Glass bell jar for acoustic protection
4.Additional cantilever packages and gratings
5.enhanced LFM mode sensitivity due to a spot-like laser diode
6.additional LockIn amplifier for dynamic EFM or MFM
7.implemented Kelvin feedback
8.current amplifier for conductance AFM incl. power supply
SPIP – Scanning Probe Image Processor - with all costumer specific modules from Imaging
Metrology
9. 2nd TFT monitor